Document

Noise in alloy junction transistors

About this Digital Document

A study is made of the noise-producing mechanisms in semiconductor devices. Using the mechanisms known to be intrinsic to a transistor, a mathematical model is then developed to describe noise factor as a function of transistor parameters and operating conditions. Using typical values for alloy junction transistors, theoretical effects of source resistance, frequency, operating current and voltage, temperature, current gain and leakage current are developed. Experimental verification of the theorectical results is made and the two are in good agreement.
Full Title
Noise in alloy junction transistors
Contributor(s)
Thesis advisor: Karakash, John J.
Publisher
Lehigh University
Date Issued
1967-04
Language
English
Type
Genre
Form
electronic documents
Department name
Electrical Engineering
Digital Format
electronic documents
Media type
Creator role
Graduate Student
Identifier
1048261532
https://asa.lib.lehigh.edu/Record/10946748
Brennan, Thomas Frederick. (1967). Noise in alloy junction transistors (1–). https://preserve.lehigh.edu/lehigh-scholarship/graduate-publications-theses-dissertations/theses-dissertations/noise-alloy
Brennan, Thomas Frederick. 1967. “Noise in Alloy Junction Transistors”. https://preserve.lehigh.edu/lehigh-scholarship/graduate-publications-theses-dissertations/theses-dissertations/noise-alloy.
Brennan, Thomas Frederick. Noise in Alloy Junction Transistors. Apr. 1967, https://preserve.lehigh.edu/lehigh-scholarship/graduate-publications-theses-dissertations/theses-dissertations/noise-alloy.