Electrical characterization of polysilicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile semiconductor memory devices

Electrical characterization of polysilicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile semiconductor memory devices

Advanced Search

Choose the citation style.
Electrical characterization of polysilicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile semiconductor memory devices. (2003). Electrical characterization of polysilicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile semiconductor memory devices.

Datastream Download