Date

1972

Document Type

Thesis

Degree

Master of Science

Department

Materials Science and Engineering

First Adviser

Notis, Michael R.

Abstract

The effects of the low temperature annealing on the electrical and optical properties of the diodes were monitored by measuring the electroluminescent efficiency, emission spectra, juntion capacitance-voltage and the forward current-voltage characteristics of the devices.

Comments

Former department name: Metallurgy and Materials Science

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