Master of Science
Materials Science and Engineering
Tauber, Richard N.
An optical method for obtaining an indication of the crystallographic perfection of single crystal silicon is described, and the effects of various growth parameters on the residual stress and radial dislocation distributions are studied.
DeNicola, Rickard O., "A study of the effect of growth parameters on some properties of czochralski - grown silicon crystals" (1968). Theses and Dissertations. 3686.