Master of Science
Arthur I. Larky
A number of methodshave been proposed for the measurement of resistivity of semiconductors over the past few years. Most prominent are the microwave, A.C. four-point probe, and D.C. four-point probe method.
Lagarde, A. Konrad, "A direct reading resisitvity test set for semiconductor materials" (1968). Theses and Dissertations. 3629.