Master of Science
A critical study has been made of four different techniques that are used to investigate the properties (interface state density, interface state time-constant, interface state capture cross-section, ect.) of semicondutor-insulator interface in a MIS structure.
Kar, Samares, "A critical study of the different methods of investigating semiconductor-insulator interface state properties" (1968). Theses and Dissertations. 3625.