Date

1964

Document Type

Thesis

Degree

Master of Science

Department

Electrical Engineering

First Adviser

Willner, L. B.

Abstract

The statistical analysis of the process yield for multi-stage, multi-grade manufacturing processes is a difficult problem. The probability distribution of the process yield is not available and it cannot be simply calculated by convolving and multiplying the probability distributions of the individual stage yields since statistical independence of the variables cannot be assumed, and since large uncertainties exist as to the true distribution of the stage yields themselves.

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