Date
1963
Document Type
Thesis
Degree
Master of Science
Department
Materials Science and Engineering
First Adviser
Conard, George P.
Abstract
It is proposed that stacking faults are generated by the collapse of vacancy clusters as a natural consequence of the low stacking fault energy.
Recommended Citation
Notis, Michael H., "Stacking faults in epitaxial silicon thin films" (1963). Theses and Dissertations. 3158.
https://preserve.lehigh.edu/etd/3158
Comments
Former department name: Metallurgy and Materials Science